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2026_ML pour la reconnaisance des formes

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For a given number of training samples, when we increase the predictor's capacity, the difference between the empirical risk and the expected risk should :

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True or False ?

The empirical risk computed on the test set (aka test risk, test error) is an unbiased estimated of the expected risk.

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If the difference between the performance of your classifier on train and test sets is small, and both performances are high (good),  what may be happening?

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Suppose we have an array of sample brain scans X of shape (256 × 240 × 240 × 4), and an array Y of target segmentation for tumors, of shape (256 × 240 × 240 × 1), just like in practice session 6.

Scans are in 2D, and we do not care about masks here.

The first dimension corresponds to a patient, the second and third to image rows and columns, and the last dimension to modalities for X or class for Y.

Segmentation is performed by training a pixel classifier.

Among the following approaches to create train and validation sets from an original train set, what is the appropriate one?

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For a given predictor capacity, when we increase the number of training samples, the difference between the empirical risk and the expected risk should :

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0%
View this question

True or False ?

The empirical risk computed on the train set (aka train risk, train error) is an unbiased estimated of the expected risk.

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0%
View this question

If the difference between the performance of your classifier on train and test sets is small, and both performances are low (not good),  what may be happening?

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If the difference between the performance of your classifier on train and test sets is important, what may be happening?

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What is the capacity of the family of affine functions (lines) in bounded (i.e. any compact subset of) ?

Remind that, for classification, the capacity of F is defined by Vapnik & Chervonenkis as the largest n such that there exist a set of examples Dn such that one can always find an f ∈ F which gives the correct answer for all examples in Dn, for any possible labeling.

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The error of some classifier can be decomposed into several terms.

Select these terms among the following ones.

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