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The fraction of defective integrated circuits produced in a photolithography pr...
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The fraction of defective integrated circuits produced
in a photolithography process is being studied. A random sample
of 300 circuits is tested, revealing 13 defectives.
Calculate a 95% upper confidence boundon the fraction of
defective circuits.
Let z0.025 = 1.96; z0.05 = 1.65.0%
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