Which of the following is most true as it applies to design for test (DFT):

Question

Accepted Answer

Scan-path testing is used to give access to the internal combinational logic from the chip I/O.

Answer

Design of a good DFT strategy is critical to helping you debug the chip before sending it to fabrication.

Answer

Random testing is always preferable to scan path testing.

Answer

Running your verification vectors on your chip to test it will ensure that there are no manufacturing defects in the chip.

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